第16回
CdTeピクセル検出器と放射光白色X線による応力評価への挑戦
著者:
鈴木 賢治,(新潟大),城 鮎美,(量研機構),豊川 秀訓,佐治 超爾,(高輝度光科学研究センター),菖蒲 敬久,(JAEA)
発刊日:
公開日:
キーワードタグ:
In this study, we proposed a double exposure method using synchrotron white X-rays (DEM-WX) to measure strains of coarse-grained materials, and examined its feasibility. The X-ray diffractions were measured by a CdTe pixel detector. The CdTe pixel detector can resolve photon energy by changing a threshold voltage. Calibrating each pixel of the detector using characteristic X-rays of Pb and W foils, the images by threshold X-ray energy were obtained. The difference image, which is like a diffraction image wi...
英字タイトル:
Feasibility Study on Stress Measurements using CdTe Pixel Detector and Synchrotron White X-Rays