スマートアレイプローブの開発
Development of Smart Array Probe
著者:
前田 功太郎 K. MAEDA 下根 純理 J. SHIMONE 布子 章 A. NUNOKO 赤川 純一 J. AKAGAWA 永田 泰章 Y. NAGATA 泉田 博幸 H. IZUMIDA 原田 豊 Y. HARADA
発刊日:
公開日:
Array ProbeEddy Current TestingNondestructive TestingNumerical SolutionSteam GeneratorStress Corosion CrackTransmit-Receive Type Probe
概要
In 1998, NEL developed X-probe in cooperation with foreign firms. Recently NEL has developed the transmit-receive type array probe characterized with a significantly improved resolution for circumferential cracks. Th e advanced probe, called Smart Array Probe, has been developed based on the result of detailed numerical simulation. The doubled channels in the circumferential mode have greatly improved the circumferential resoluti on of Smart Array Probe. With all the circumferential mode channels on the same circle, there is no need for axial position correction. In addition, the detectability both in the axial and circumferential modes has b een improved by putting receivers close to transmitters. This report describes the result of numerical simulation for Smart Array Probe and the results of detectability comparison tests using various test specimens.
