（新潟大)
著者に関連した記事は2件です。
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第16回
CdTeピクセル検出器と放射光白色Ｘ線による応力評価への挑戦
著者:
鈴木 賢治,（新潟大),城 鮎美,（量研機構),豊川 秀訓,佐治 超爾,（高輝度光科学研究センター),菖蒲 敬久,（JAEA)
発刊日:
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CdTe Pixel Detector Coarse Grain Double Exposure Method Syn- chrotron White X-ray X-Ray Stress Measurement
鈴木 賢治,（新潟大),城 鮎美,（量研機構),豊川 秀訓,佐治 超爾,（高輝度光科学研究センター),菖蒲 敬久,（JAEA)
発刊日:
公開日:
キーワードタグ:
CdTe Pixel Detector Coarse Grain Double Exposure Method Syn- chrotron White X-ray X-Ray Stress Measurement
In this study, we proposed a double exposure method using synchrotron white X-rays (DEM-WX) to measure strains of coarse-grained materials, and examined its feasibility. The X-ray diffractions were measured by a CdTe pixel detector. The CdTe pixel detector can resolve photon energy by changing a threshold voltage. Calibrating each pixel of the detector using characteristic X-rays of Pb and W foils, the images by threshold X-ray energy were obtained. The difference image, which is like a diffraction image wi...
英字タイトル:
Feasibility Study on Stress Measurements using CdTe Pixel Detector and Synchrotron White X-Rays
英字タイトル:
Feasibility Study on Stress Measurements using CdTe Pixel Detector and Synchrotron White X-Rays
第15回
二重露光法による粗大粒材の応力測定
著者:
鈴木 賢治,（新潟大),菖蒲 敬久,（JAEA）,城 鮎美,（量子科学機構）
発刊日:
公開日:
キーワードタグ:
Coarse Grain Double Exposure Method Hard Synchrotron X-ray X-Ray Stress Measurement
鈴木 賢治,（新潟大),菖蒲 敬久,（JAEA）,城 鮎美,（量子科学機構）
発刊日:
公開日:
キーワードタグ:
Coarse Grain Double Exposure Method Hard Synchrotron X-ray X-Ray Stress Measurement
As a new X-ray stress measurement method for coarse grain material, the double exposure method (DEM) is proposed, and its analysis is explained in this paper. A diffraction angle can be obtained from an incident and a spotty diffracted beams. Each X-ray beam is measured by an area detector on a linear motion stage on the 2 θ-arm in the DEM. To examine the validity of the DEM, the residual stress of the plastically bent specimen was measured. In addition, the residual stress distribution of the indentation s...
英字タイトル:
Stress Measurement of Coarse Grains Using Double Exposure Method
英字タイトル:
Stress Measurement of Coarse Grains Using Double Exposure Method