二重露光法による粗大粒材の応力測定
概要
As a new X-ray stress measurement method for coarse grain material, the double exposure method (DEM) is proposed, and its analysis is explained in this paper. A diffraction angle can be obtained from an incident and a spotty diffracted beams. Each X-ray beam is measured by an area detector on a linear motion stage on the 2 θ-arm in the DEM. To examine the validity of the DEM, the residual stress of the plastically bent specimen was measured. In addition, the residual stress distribution of the indentation specimen was measured. The result by the DEM was similar to the result simulated by the finite element method. As a result, the DEM is useful for the X-ray stress measurement method for coarse grain material.
