Stress Measurements of Austenitic Stainless Steel using Hard Synchrotron X-Rays
鈴木 賢治 （新潟大） 城 鮎美 （量研機構） 菖蒲 敬久 （JAEA） 豊川 秀訓 佐治 超爾 （JASRI）
Austenitic Stainless SteelCCD CameraCdTe Pixel DetectorDouble Exposure MethodHard Synchrotron X-raysX-Ray Stress Measurement
In this study, stress measurements were performed using a double exposure method with hard synchrotron monochromatic X-rays, and its validity was proved. The diffractions of the shrink-?tted ring of austenitic stainless steel SUS304 were measured by the CdTe pixel detector. The used X-rays were 70, 80 and 90 keV. The measured stress distributions with the 311 diffraction of γ-Fe corresponded to the predicted result. In addition, The stress distribution of the shrink-?tted ring was measured by the CCD camera with monochromatic synchrotron X-ray of about 70 keV. Although enough precision was not obtained from the measured result, the measured stress distribution expressed the feature of the shrink-?tted ring. This is caused by the low diffraction angle and the short distance between the detectors.