Evaluation of Internal Stresses using Area Detectors
鈴木 賢治 Kenji SUZUKI 菖蒲 敬久 Takahisa SHOBU 城 鮎美 Ayumi SHIRO 豊川 秀訓 Hidenori TOYOKAWA
Area DetectorRotating-slitSynchrotronX-Ray Stress Measurement
An area detector technique has to be applied to the strain scanning method for materials with coarse grains. A new rotating slit system was designed for a 2-dimensional (2D) detector strain scanning method. The rotating slit system can focus the 2D detector on the center of the goniometer, and the gauge volume is made by the rotating slit system. The stress measurements were examined with the rotating slit and 2D detector. The measured diffraction spots shifted for the 2D strain scanning. The magnitude of the shift of the diffraction spot was very large as compared with the shift due to the strain. This phenomenon was caused by interaction between the gauge volume and the coarse grain. That is a coarse grain effect. To overcome the coarse grain effect, we propose a diffraction spot trace method (DSTM), which is constructed by the rotating slit and the PILATUS detector. The bending stress distribution of the coarse grain aluminum alloy was measured by DSTM. The measured stress was consistent with the applied stress.